Artificial Intelligence
Author: Manish Talreja
Identify the location of anomalies using Amazon Lookout for Vision at the edge without using a GPU
Automated defect detection using computer vision helps improve quality and lower the cost of inspection. Defect detection involves identifying the presence of a defect, classifying types of defects, and identifying where the defects are located. Many manufacturing processes require detection at a low latency, with limited compute resources, and with limited connectivity. Amazon Lookout for […]